邓元龙
教授
性别: 男
邮箱: dengyl@szu.edu.cn
办公室: 机电楼S613室
人才称号: 无
最终学位: 博士
办公电话: 0755-22673855
导师资格: 硕士生导师
研究领域:
机器视觉与检测技术、测试计量技术及仪器、传感器
教育背景:
2003–2007,天津大学,精密仪器与光电子工程学院,博士学位;
1994–1997,中国计量科学研究院,测试计量技术及仪器专业,硕士学位;
1989–1994,清华大学,精密仪器与机械学系,学士学位。
工作履历:
1997.9至今,澳门·威尼克斯人(中国区)官方网站,讲师、副教授(2005.12)、教授(2009.12)
主持项目:
主持完成国家自然科学基金面上项目2项,在研1项;主持完成广东省产学研项目1项,在研1项;主持完成深圳市科技计划项目6项,在研1项;主持完成横向课题2项。
代表期刊论文 :
1.Yuanlong Deng, Xizhou Pan, Xiaopin Zhong, and Guangjun Huang, "Improved imaging of extremely-slight transparent aesthetic defects using a saturation level-guided method," Opt. Express 28, 3699-3716 (2020).
2.Yuanlong Deng, Xizhou Pan, Xiaopin Zhong. Efficient Shape Estimation of Transparent Microdefects with Manifold Learning and Regression on a Set of Saturated Images. Appl. Sci. 2020, 10, 385.
3.Yuanlong Deng,Xizhou Pan,Xingzheng Wang,Xiaopin Zhong. Vison-Based 3D Shape Measurement System for Transparent Microdefect Characterization.IEEE ACCESS,Vol.7:105721 - 105733,DOI:10.1109/ACCESS.2019.2931194,26 July 2019.
4.Deng Yuanlong,Xu Shaopeng,Chen Haoquan,Liang Zhanheng,Yu Cilong. Inspection of extremely slight aesthetic defects in a polymeric polarizer using the edge of light between black and white stripes,2018 Polymer Testing 65,pp.169.
5.Deng Yuanlong,Xu Shaopeng,Lai Wenwei. A novel imaging-enhancement-based inspection method for transparent aesthetic defects in a polymeric polarizer,2017,Polymer Testing 61,pp.333.
6. Lai Wenwei,Zeng Xiaoxin,He Jian,Deng Yuanlong*. Aesthetic defect characterization of a polymeric polarizer via structured light illumination,2016,Polymer Testing 53,pp.51.
7.Yu cilong, Chen Peibin, etal., Deng Yuanlong*. Saturated Imaging for Inspecting Transparent Aesthetic Defects in a Polymeric Polarizer with Black and White Stripes,Materials,2018,DOI: 10.3390/ma11050736.
8.基于改进LBP和SVM的偏光片外观缺陷检测与分类.黄广俊,邓元龙. 计算机工程与应用,2020.1(在线发表)
代表会议论文:
1.A super-resolution method of retinal image based on laser scanning ophthalmoscope,Proceedings of SPIE-The International Society for Optical Engineering 2019,DOI: 10.1117/12.2542197 EID: 2-s2.0-85077815339.
2.High-precision Measurement Method for Copper Plate Hole Size Based on Partial Area Effect.Ruiyuan He,Xiaopin Zhong ,Yuanlong Deng.Publication Year: 2019, Page(s): 524 - 528,2019 IEEE 2nd International Conference on Information Communication and Signal Processing (ICICSP).
3.Estimating shape of convex and concave defects of polymeric polarizers,Xizhou Pan, Yuanlong Deng, and Xiaopin Zhong, 970-971,Proceedings of The 2019 IEEE InternationalConference on Real-time Computing and Robotics,August 4-9, 2019, Irkutsk, Russia.
4.A simple inspection technique of visual defects of polymer polarizer Deng, Y.,Luo, F.,Wu, Y.,Zhong, X. 2013 IEEE International Conference on Information and Automation, ICIA 2013 ,pp.1120
代表专利:
1.一种用于检测偏光片内部缺陷的成像仿真方法及系统,发明专利,专利号:ZL 201510517279.5
2.一种用于外差干涉椭偏测量非线性误差补偿方法,发明专利,专利号:ZL 200910105389.5
3.一种偏光膜外观缺陷检测系统,实用新型专利,专利号:ZL 201220062830.3
4.一种透明薄膜缺陷形态测量方法及系统,发明专利,申请号:201910122114.6
获得荣誉:
1,“用于工程结构和危化品安全监测的传感器关键技术”获得广东省科技进步三等奖(2011.2,排名第三);
2,“面向工程结构与危化品安全监测的新型光纤传感器和纳米气体传感器技术”获得深圳市科技创新奖(2010.12,排名三);
主要学术兼职:
深圳市传感器技术重点实验室副主任,广东省自动化类专业教指委秘书长,中国图像图形学学会视觉检测专家委员会委员,广东省科协智能制造学会联合体专家委员会委员,深圳市产教融合促进会副会长,教育部自动化类专业教指委华南华中区域协作委员